{"id":899,"date":"2020-04-10T10:23:08","date_gmt":"2020-04-10T10:23:08","guid":{"rendered":"http:\/\/demo6.aiwalls.com\/ipapps\/?p=899"},"modified":"2020-04-10T10:23:08","modified_gmt":"2020-04-10T10:23:08","slug":"groundbreaking-method-detects-defective-computer-chips","status":"publish","type":"post","link":"https:\/\/www.txd9.com\/?p=899","title":{"rendered":"Groundbreaking method detects defective computer chips"},"content":{"rendered":"<p>            <img decoding=\"async\" src=\"http:\/\/pic1.tadke.com\/imgs\/tech2lims\/0409\/4iud2mi2aqh.jpg\" alt=\"Groundbreaking method detects defective computer chips\"><\/p>\n<p>Guaranteeing that computer chips, that can consist of billions of interconnected transistors, are manufactured without defects is a challenge. But how to determine if a chip is compromised?<\/p>\n<p>        <!-- \/4988204\/TechX_Story_InText_Box --><\/p>\n<p>Now a technique co-developed by researchers at the Paul Scherer Institut in Switzerland and researchers at the USC Viterbi School of Engineering would allow companies and other organizations to non-destructively scan chips to ensure that they haven&#8217;t been altered and that they are manufactured to design specifications without error.<\/p>\n<p>Hardware security is a critical issue. Anthony F. J. Levi, Department Chair of the Ming Hsieh Department of Electrical Engineering-Electrophysics, co- author of the study, &#8220;Three-dimensional imaging of integrated circuits with macro- to nanoscale zoom&#8221; published in <i>Nature Electronics<\/i>, says that &#8220;the supply chain for advanced electronics is susceptible.&#8221;<\/p>\n<p>With this new method, it is possible to validate the integrity of computer chips using x-rays.<\/p>\n<p>Called ptychographic X-ray laminography, the technique utilizes x-rays from a synchrotron to illuminate a small region of a rotating chip at an angle of 61 degrees (with respect to the normal of the chip plane). The resulting diffraction patterns are measured with a photon-counting detector array. The data are then used to generate high-resolution slice images of the chip, from which 3-D renderings are created.<\/p>\n<figure class=\"mb-4\">\n<p>            <video class=\"embed-responsive embed-responsive-16by9\" id=\"jwVID58406\" controls poster=\"https:\/\/scx1.b-cdn.net\/gfx\/video_tmb\/2019\/groundbreaki.mp4.jpg\"><\/p>\n<p>        <\/video><figcaption class=\"text-darken text-low-up mt-4\">Chip Scan technology developed in a collaboration between the University of Southern California, the Paul Scherrer Institute, and Global Foundries.Video is a fly through a 3D reconstruction of a chip manufactured by Global Foundries and imaged using advanced x-ray imaging technology. Credit: University of Southern California and Paul Scherrer Institut<\/figcaption><p>Once the 3-D image is generated, it can be compared with the original design as a type of forensics to help companies or organizations that are looking to ensure chips are manufactured correctly and meet design specifications.<\/p>\n<p>The researchers indicate that chips have signature features, so it is possible to tell how and where they were manufactured.<\/p>\n<p>In addition, this process allows for reverse engineering of circuit designs without destroying the chip.<\/p>\n<p>Levi says, &#8220;The majority of a chip&#8217;s intelligence is how it is wired. It is like the connectome of a brain. By viewing a chip in detail, you can non-destructively figure out what it does. With this technology, hiding intellectual property in a chip is over.&#8221;<\/p>\n<p>Levi imagines that the technology could one day contribute to a certification process to ensure the integrity of chips that are inserted into a computer or in communication hardware used by global businesses and governments.<\/p>\n<p>The next steps are to continue to improve imaging speed and resolution and to further improve X-ray microscope performance.<\/p>\n<hr>\n","protected":false},"excerpt":{"rendered":"<p>Guaranteeing that computer chips, that can consist of billions of interconnected transistors, are manufactured without defects is a challenge. But how to determine if a<\/p>\n","protected":false},"author":1,"featured_media":900,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[7],"tags":[483,481,480,482,291],"class_list":["post-899","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-daily-tips","tag-computer","tag-defective","tag-detects","tag-groundbreaking","tag-method"],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.txd9.com\/index.php?rest_route=\/wp\/v2\/posts\/899","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.txd9.com\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.txd9.com\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.txd9.com\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.txd9.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=899"}],"version-history":[{"count":0,"href":"https:\/\/www.txd9.com\/index.php?rest_route=\/wp\/v2\/posts\/899\/revisions"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.txd9.com\/index.php?rest_route=\/wp\/v2\/media\/900"}],"wp:attachment":[{"href":"https:\/\/www.txd9.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=899"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.txd9.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=899"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.txd9.com\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=899"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}